Issue |
EAS Publications Series
Volume 45, 2010
GAIA: At the Frontiers of Astrometry
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Page(s) | 37 - 40 | |
DOI | https://doi.org/10.1051/eas/1045006 | |
Published online | 15 February 2011 |
C. Turon, F. Meynadier and F. Arenou (eds)
EAS Publications Series, 45 (2010) 37-40
Long Term Analysis for the BAM device
INAF-Osservatorio Astronomico di Torino, Italy
e-mail: bonino@oato.inaf.it
Algorithms aimed at the evaluation of critical quantities are based on models with many parameters, which values are estimated from data. The knowledge, with high accuracy, of these values and the control of their temporal evolution are important features. In this work, we focus on the latter subject, and we show a proposed pipeline for the BAM (Basic Angle Monitoring) Long Term Analysis, aimed at the study of the calibration parameters of the BAM device and of the Basic Angle variation, searching for unwanted trends, cyclic features, or other potential unexpected behaviours.
© EAS, EDP Sciences 2011