Oscillator Stengths and Their Uncertainties

¹ Dept. of Physics, Catholic University of America, 620 Michigan Ave NE, Washington DC 20064, USA
² NASA Goddard Space Flight Center, Code 667, Greenbelt, MD 20771, USA
e-mail: Glenn.M.Wahlgren@nasa.gov

Abstract

The oscillator strength is a key parameter in the description of the line absorption coefficient. It can be determined through experiment, abinitio and semi-empirical calculations, and backward analysis of line profiles. Each method has its advantages, and the uncertainty attached to its determination can range from low to indeterminable. For analysis of line profiles or equivalent widths the uncertainty in the oscillator strength can rival or surpass the difference between the derived element abundance from classical LTE and non-LTE analyses. It is therefore important to understand the nature of oscillator strength uncertainties and to assess whether this uncertainty can be a factor in choosing to initiate a non-LTE analysis or in the interpretation of its results. Methods for the determination of the oscillator strength are presented, prioritizing experiments, along with commentary about the sources and impact of the uncertainties. The Se I spectrum is used to illustrate how gf-values can be constructed from published data on atomic lifetimes and line intensities.